Probing For Overshoot/Undershoot Tests; Test Procedure - Keysight U7233A Testing Notes

5 Single-Ended Signals Overshoot/Undershoot Tests

Probing for Overshoot/Undershoot Tests

When performing the Single-Ended Signals Overshoot/Undershoot tests, the DDR1 Compliance Test
Application will prompt you to make the proper connections as shown in the following diagram. Refer
to the Connection tab in DDR1 Compliance Test Application for the exact number of probe
connections.
DDR DIMM
Figure 16
You can use any of the oscilloscope channels as Pin Under Test (PUT) source channel. You can
identify the channels used for each signal in the Configuration tab of the DDR1 Compliance Test
Application. (The channel shown in
For more information on the probe amplifiers and differential probe heads, see
Probing," starting on page 185.

Test Procedure

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Infiniium Oscilloscope
InfiniiMax solder-in probe
Probing for Single-Ended Signals Overshoot/Undershoot Tests
Start the automated test application as described in
Application" on page 27.
Ensure that the RAM reliability test software is running on the computer system where the DDR
Device Under Test (DUT) is attached. This software will perform a test on all unused RAM on the
system by producing a repetitive burst of read-write data signals to the DDR memory.
Connect the differential solder-in probe head to the PUTs on the DDR DIMM.
Figure 16 is just an example).
"Starting the DDR1 Compliance Test
DDR1 Compliance Testing Methods of Implementation
Chapter 14, "InfiniiMax