Keysight U7233A Testing Notes page 149

Keysight U7233A/U7233B DDR1 Compliance Test Application
Compliance Testing Methods of Implementation
11 Advanced Debug Mode Clock
Tests
Probing for Clock Tests / 150
Clock Period Jitter - tJIT(per) - Test Method of Implementation / 154
Cycle to Cycle Period Jitter - tJIT(cc) - Test Method of Implementation / 155
Cumulative Error - tERR(n per) - Test Method of Implementation / 156
Half Period Jitter - tJIT(duty) - Test Method of Implementation / 157
This section provides the Methods of Implementation (MOIs) for Rising Edge and Pulse
Measurements Clock tests using an Keysight 54850A, 8000, 80000 or 90000A series Infiniium
oscilloscope, recommended InfiniiMax 116xA or 113xA probe amplifiers, E2677A differential solder-in
probe head and the DDR1 Compliance Test Application.