Advanced Debug Mode High-Low State Ringing Tests - Keysight U7233A Testing Notes

Ddr1 compliance test application
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Keysight U7233A/U7233B DDR1 Compliance Test Application
Compliance Testing Methods of Implementation
12 Advanced Debug Mode
High-Low State Ringing Tests
Probing for Advanced Debug Mode High-Low State Ringing Tests / 160
High State Ringing Tests Method of Implementation / 164
Low State Ringing Tests Method of Implementation / 166
This section provides the Methods of Implementation (MOIs) for Advanced Debug Mode High-Low
State Ringing tests using an Keysight 54850A, 8000, 80000 or 90000A series Infiniium oscilloscope,
recommended InfiniiMax 116xA or 113xA probe amplifiers, E2677A differential solder-in probe head
and the DDR1 Compliance Test Application.

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