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Figure 37
DDR1 Compliance Testing Methods of Implementation
Connect the differential solder-in probe head to the PUTs on the DDR DIMM.
Connect the oscilloscope probes to any channels of the oscilloscope.
In the DDR1 Test Application, click the Set Up tab.
Select the Speed Grade options. For the Single-Ended Signals AC Input Parameters Tests, you
can select any speed grade within the selection: DDR1-200, DDR1-266, DDR1-333, DDR1-400.
Type in or select the Device Identifier as well as User Description from the drop-down list. Enter
your comments in the Comments text box.
Click the Select Tests tab and check the tests you want to run. Check the parent node or group to
check all the available tests within the group.
Selecting Clock Timing Tests
Clock Timing (CT) Tests
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