Data Strobe Timing (Dst) Tests - Keysight U7233A Testing Notes

Keysight U7233A/U7233B DDR1 Compliance Test Application
Compliance Testing Methods of Implementation
7 Data Strobe Timing (DST)
Tests
Probing for Data Strobe Timing Tests / 82
tHZ(DQ), DQ High Impedance Time From CK/CK# - Test Method of Implementation / 85
tHZ(DQS), DQS High Impedance Time From CK/CK# - Test Method of Implementation / 87
tLZ(DQS), DQS Low-Impedance Time from CK/CK# - Test Method of Implementation / 89
tLZ(DQ), DQ Low-Impedance Time from CK/CK# - Test Method of Implementation / 91
tDQSQ, DQS-DQ Skew for DQS and Associated DQ Signals - Test Method of Implementation / 94
tQH, DQ/DQS Output Hold Time From DQS - Test Method of Implementation / 96
tDQSS, DQS Latching Transition to Associated Clock Edge - Test Method of Implementation / 98
tDQSH, DQS Input High Pulse Width - Test Method of Implementation / 100
tDQSL, DQS Input Low Pulse Width - Test Method of Implementation / 102
tDSS, DQS Falling Edge to CK Setup Time - Test Method of Implementation / 104
tDSH, DQS Falling Edge Hold Time from CK - Test Method of Implementation / 106
tWPST, Write Postamble - Test Method of Implementation / 108
tWPRE, Write Preamble - Test Method of Implementation / 110
tRPRE, Read Preamble - Test Method of Implementation / 112
tRPST, Read Postamble - Test Method of Implementation / 114
This section provides the Methods of Implementation (MOIs) for Data Strobe Timing tests using an
Keysight 54850A, 8000, 80000 or 90000A series Infiniium oscilloscope, recommended InfiniiMax
116xA or 113xA probe amplifiers, E2677A differential solder-in probe head and the DDR1
Compliance Test Application.
Both XYZ# and XYZ are referring to compliment. Thus, CK# is the same as CK.
NOTE