Probing For Advanced Debug Mode High-Low State Ringing Tests; Test Procedure - Keysight U7233A Testing Notes

12 Advanced Debug Mode High-Low State Ringing Tests

Probing for Advanced Debug Mode High-Low State Ringing Tests

When performing the intra-pair skew tests, the DDR1 Compliance Test Application will prompt you
to make the proper connections as shown in
DDR DIMM
InfiniiMax solder-in probes
Figure 48
You can use any of the oscilloscope channels as the Pin Under Test (PUT) source channel. You
identify the channels used for each signal in the Configuration tab of the DDR1 Compliance Test
Application. (The channel shown in
For more information on the probe amplifiers and differential probe heads, see
Probing," starting on page 185.

Test Procedure

1
2
3
4
5
6
160
Infiniium Oscilloscope
Probing for Advanced Debug Mode High-Low State Ringing Tests
Start the automated test application as described in
Application" on page 27.
Ensure that the RAM reliability test software is running on the computer systems where the DDR
Device Under Test (DUT) is attached. This software will perform tests on all the unused RAM in
the system by producing repetitive bursts of read-write data signals to the DDR memory.
Connect the differential solder-in probe head to the PUT on the DDR DIMM.
Connect the oscilloscope probes to any of the oscilloscope channels.
In the DDR1 test application, click the Set Up tab.
Select Advanced Debug as the Test Mode option.
Figure 48.
Figure 48 is just an example.)
"Starting the DDR1 Compliance Test
DDR1 Compliance Testing Methods of Implementation
Chapter 14, "InfiniiMax