Advanced Debug Mode Clock Tests; Probing For Clock Tests; Test Procedure - Keysight U7233A Testing Notes

11

Advanced Debug Mode Clock Tests

Probing for Clock Tests

When performing the Advanced Debug Mode Clock tests, the DDR1 Compliance Test Application will
prompt you to make the proper connections. The connections for Rising Edge and Pulse
Measurement Clock tests may look similar to the following diagram. Refer to the Connection tab in
DDR1 Electrical Performance Compliance application for the exact number of probe connections.
DDR DIMM
Figure 45
You can use any of the oscilloscope channels as the Pin Under Test (PUT) source channel. You can
identify the channels used for each signal in the Configuration tab of the DDR1 Compliance Test
Application. (The channel shown in
For more information on the probe amplifiers and differential probe heads, see
Probing," starting on page 185.

Test Procedure

1
2
3
4
150
Infiniium Oscilloscope
InfiniiMax solder-in probe
Probing for Measurement Clock Tests
Start the automated test application as described in
Application" on page 27.
Ensure that the RAM reliability test software is running on the computer systems where the DDR
Device Under Test (DUT) is attached. This software will perform tests on all the unused RAM in
the system by producing repetitive bursts of read-write data signals to the DDR memory.
Connect the differential solder-in probe head to the PUT on the DDR DIMM.
Connect the oscilloscope probes to any of the oscilloscope channels.
Figure 45 is just an example.)
"Starting the DDR1 Compliance Test
DDR1 Compliance Testing Methods of Implementation
Chapter 14, "InfiniiMax