Agilent Technologies ENA Series User Manual page 346

Specifications and Supplemental Information
Test Port Input
Table 15-11 Test Port Input (Trace Noise)
Description
*1
Trace Noise Phase
300 kHz to 3 MHz
3 MHz to 4.2 GHz
4.2 GHz to 7.5 GHz
7.5 GHz to 8.5 GHz
*1.Trace noise is defined as a ratio measurement of a through, with the source set to 0 dBm.
338
Specification Supplemental Information
0.035 ° rms
(at IFBW = 3 kHz, typical)
0.05 ° rms
(at IFBW = 3 kHz, high
temperature mode: ON, typical)
0.007 ° rms
(at IFBW = 3 kHz, typical)
0.02 ° rms
(at IFBW = 3 kHz, high
temperature mode: ON, typical)
0.021 ° rms
(at IFBW = 3 kHz, typical)
0.035 ° rms
(at IFBW = 3 kHz, high
temperature mode: ON, typical)
0.035 ° rms
(at IFBW = 3 kHz, typical)
0.05 ° rms
(at IFBW = 3 kHz, high
temperature mode: ON, typical)
Chapter 15