LAPIS Semiconductor ML62Q1000 Series User Manual page 24

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Buzzer
−
4 buzzer mode (Repeat sound, Single sound, Intermittent sound 1 and Intermittent sound 2)
−
8frequencies (4.096kHz to 293Hz)
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15 step duty (1/16 to 15/16)
−
Slectable initial level (L or H)
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CRC(Cycle Redundancy Check) operation function
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Generation eqution: X
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LSB first or MSB first is selectable
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Automatic CRC mode: Automatic CRC calculation with data of the program memory in HALT mode
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LCD driver (ML62Q1700 group)
−
Max. 480 dots (60seg x 8 com)
ML62Q1700/ML62Q1701/ML62Q1702/ML62Q1703/ML62Q1704：
ML62Q1700/ML62Q1701/ML62Q1702/ML62Q1703/ML62Q1704：
ML62Q1720/ML62Q1721/ML62Q1722/ML62Q1723/ML62Q1724/
ML62Q1725/ML62Q1726/ML62Q1727：
ML62Q1733/ML62Q1734/ML62Q1735/ML62Q1736/ML62Q1737：
ML62Q1743/ML62Q1744/ML62Q1745/ML62Q1746/ML62Q1747：
*1
: Five pins are shared for common or segment, selectable by setting a SFR
−
1/3 bias (built-in bias generation circuit)
−
Frame frequency (Approx. 32Hz，38Hz，64Hz，75Hz，128Hz and 150Hz)
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Four bias generation modes (Internal voltage boost, External capacitive voltage divde, Internal capacitive voltage
divde and External suppy voltages)
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Contrast adjustment (32 steps) is available in the Internal voltage boost mode.
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Safety Function
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Automatic switching to the internal low-speed RC oscillation in case the low-speed crystal oscillation stopped
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RAM/SFR guard
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Automatic CRC calculation with data of program memory
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RAM parity error detection
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ROM unused area access reset
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Clock mutual check
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WDT counter check
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Successive approximation type A/D converter test
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UART test
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Synchronous serial test
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2
I C bus test
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General port test
FEUL62Q1000
16 12 5
+X +X +1
*1
24seg×8com (com Max),
27seg×8com (com Max.),
35seg×8com (com Max.),
45seg×8com （com Max.）,
60seg×8com （com Max.）,
ML62Q1000 Group User's Manual
29seg×3com (seg Max.)
32seg×3com (seg Max.)
40seg×3com (seg Max.)
50seg×3com （seg Max.）
65seg×3com （seg Max.）
Chapter 1 Overview
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