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Introduction
System Structure
System Structure
This section explains the structure of the system.
Measuring Instrument System
The measuring instrument system of Agilent E5022/E5023 have three major parts namely:
•
Signal Generation Part
•
Agilent E5037A/B/C/D Data Generator Module
•
Agilent E5043A/B/C Head Amplifier Control Unit
•
Agilent E5039A/B/C Bit Error Test Module (Optional)
•
Signal Distribution Part
•
Agilent E5036A Filter Matrix Module
•
Measurement Part
•
Agilent E5038A/B Parametric Measurement Module
•
Agilent E5039A/B/C Bit Error Test Module (Optional)
•
Agilent E5040A Spectrum Measurement Module
•
Agilent E5041A Dual Counter Module (Optional)
•
Oscilloscope (Optional)
Flow of Measurement Signal
The signal produced by the E5037A/B Data Generator Module is inputted to the head
amplifier. When the spinstand is a high TPI type, the signal from the E5037C/D goes
through the E5043A/B/C and inputted to the head amplifier. For the compatibility of
E5037A/B/C/D and E5043A/B/C, see Table 1-1 on page 22.
The head amplifier writes the data with a specified amount of write current to the media.
When reading the data, as specified by the amount of read current, the read data is
amplified by the head amplifier and inputted into the Filter Matrix Module.
The Filter Matrix Module filters out the signal before distributing it to each measuring
instrument. The Filter Matrix Module is equipped with replaceable four filters. The user
can set any of the four filters as desired. The signal received by parametric module,
oscilloscope and dual counter module will be filtered out from this module. However, for
the spectrum measurement module and the bit error test module, the received signal is a
non-filtered signal. The signal is simply pre-amplified as it passes through the filter matrix
module.
According to what is measured, one of module in measuring part is activated to measure.
For example, Narrow Band TAA is measured by the Spectrum Measurement Module.
Under normal measurement operation the data generator module is used to produce the
signal needed for measurement. The bit error test module on the other hand, writes and
reads its own signal. In other words, it produces its own signal and compare with its
read-back data.
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Chapter 1
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