Agilent Technologies E5022A Operation Manual page 336

Hard disk read/write test system
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Table 6-49
Number of Segment per one track:
Total Segments:
Parameters
Track Test
Table 6-50
Parameters:
Measurements using the Oscilloscope
Table 6-51
Analysis:
Measurements using the Agilent E5039B/C Bit Error Test Module
OTC Measurement
747 Measurement
Channel Resister Sweep Measurement
Channel Quality Monitor Function
Automatic Channel Optimization Function
Chapter 6
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Popcorn Noise Measurement
1 to 100 segments (Maximum number of
segment s per one track depends on Write/Read
time settings and spindle rotation speed.)
1 to 10,000 segments
E5038A: Histogram by 20 MHz sampling
E5041A: Error Counts
Write track width, Read track width, Read/Write offset,
Maximum TAA, Squash Ratio, OTRC, Squeezed OTRC
Average the data over the repetitive cycle of data pattern.
For HF, LF, and Isolated Pulse patterns:
TAA+, TAA-, TAAp-p, TAA asymmetry
PW+, PW-, PW asymmetry, PW time asymmetry
BL+, BL-, BL separation
For a Pseudo Random pattern :
NLTS: Auto correlation, Di-pulse extraction
Level of an echo at a specified location
S/N ratio by auto correlation method
Specifications
E5023A Specifications
Triple
335

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