Agilent Technologies E5022A Operation Manual page 188

Hard disk read/write test system
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[747] Test
Measurement
1. Click on the [747] button to open the 747 measurement menu.
Procedure
Exec. Optimize
Abort
2. Set the parameters, click on each button to enter a new value.
OTC Threshold
Meas. Byte
BER Pattern #
Track #
Adjacent Offs. Start
Chapter 3
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VEE Measurement Program Operation
Optimizes the setup parameters in the
[Optimize] menu for optimum measurement
results. Optimization is required whenever
you change the 'Data Rate' and 'Endec'
parameters.
Aborts unexpected long measurement.
Specifies the off-track capability threshold. If
an adjacent track is written close to the data
track, the off-track capability of the system
becomes limited.
Specifies the number of bytes to be measured.
Specifies the pattern number to be used to
write the data pattern.The data pattern of the
selected pattern number must be specified in
the [Pattern Config.] menu in advance.
Specifies the track number to be tested.
Specifies the starting point of the adjacent
track offset. This point is defined as the
distance in [µm] between the track center and
the adjacent track. The adjacent offset range
Measurement
187

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