Agilent Technologies E5022A Operation Manual page 112

Hard disk read/write test system
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Offset Step
Offset NOP
Meas. Type
NOTE
When "hpe5022_SEQ_ER_WR_M" is selected in the
"hpe5022_measureMicroTrackProfile" function, three track erase is performed as erase
sequence, however, when [Erase Write Meas.] is selected, the band erase is performed in
this VEE measurement program. In the VEE measurement program perform, the
"hpe5022_measureMicroTrackProfile" function is done in the mode of
"hpe5022_SEQ_WR_M" after band erase.
3. Click on [Measure] button to start measurement.
The narrow band track profile resulting from the micro track are displayed on the
window. The read track width is defined as the width at half amplitude level of the
track profile result.
4. Click on the [Return] button to return to Measure menu.
See also
See the "Micro Track function" in Chapter 3 of the programming manual for the parameter
range and its detailed description.
Chapter 3
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VEE Measurement Program Operation
Specifies the step by which the head is moved
when measuring the TAA track profile. If you
set this parameter with [Offset Start] and
[Offset Stop], [Offset NOP] will be computed
and updated automatically.
Specifies the number of measurement points
to build the track profile. If you set this
parameter with [Offset Start] and [Offset
Stop], [Offset Step] will be computed and
updated automatically.
Specifies the type of measurement sequence.
1) [Erase Write Meas.] means to perform a DC
band erase, write data, erase sides of the track
then measure. 2) [Write Meas.] means to write
data, erase sides of the track, then measure.
Measurement
111

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