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Measurement Definition
Measurement Parameters
Measurement Parameters
The Agilent E5022/E5023 can measure various parameters related to the disk - head
interface of a hard disk. The measurement parameters are listed in the first row of Table .
Track Average Amplitude (TAA), Pulse Width (PW) and Baseline (BL) can be measured
by either the parametric module or an oscilloscope. (The oscilloscope is installed as an
option.)
TAA can also be measured by a spectrum analyzer. In this case the TAA is referred to as
narrow band TAA (NB TAA).
TAA (not NB TAA) and PW measurements include the waveform positive and negative
peak parameters as well as asymmetry.
Baseline measurement (BL) includes the waveform positive and negative parameters as
well as separation.
"Parametric" measurement in the Agilent E5022/E5023 is defined as a measurement that
includes TAA, PW, Baseline and resolution as a group.
Also, Agilent E5022/E5023 allows you to observe a measurement parameter versus a
swept parameter, such as a read offset and a write/sense current. That is called a
'parametric sweep' measurement. Table also shows you which measurement parameters
can be measured by a 'sweep' measurement. For example, a narrow band TAA
measurement can be observed with sweep measurements of track profile, write current,
sense current, channel bit rate, and roll off.
Measurement Parameter versus Sweep Parameter
Meas.
*1
Inst.
Parameter
TAA
PM
OS
PW
PM
OS
Baseline
PM
OS
Resolution
PM
Narrow Band
SA
TAA
Time
OS
Asymmetry
NLTS by 5th
SA
harmonic
238
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Sweep Parameter
Track
Write
Sense
Profile
Current
Current
√
√
√
√
√
√
√
√
√
√
Channel
Pre
Rolloff
Bit Rate
compensation
√
√
√
√
√
√
√
Other
Stability
√
√
√
Chapter 5
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