Introduction; Interface; D.1 Introduction - Sun Microsystems UltraSPARC-I User Manual

IEEE 1149.1 Scan Interface

D.1 Introduction

UltraSPARC provides an IEEE Std 1149.1-1990 compliant test access port (TAP)
and boundary scan architecture. The primary use of 1149.1 scan interface is for
board-level interconnect testing and diagnosis.
The IEEE 1149.1 test access port and boundary scan architecture consists of three
major parts:
•
A test access port controller
•
An instruction register
•
Numerous public and private test data registers
For information about how to obtain a copy of IEEE Std 1149.1-1990, see the Bib-
liography.
D.2 Interface
The IEEE Std 1149.1-1990 serial scan interface is composed of a set of pins and a
TAP controller state machine that responds to the pins. The five wire IEEE 1149.1
interface is used in UltraSPARC. Table D-1 describes the five pins.
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