Agilent Technologies InfiniiVision 5000 Series Programmer's Manual page 781

input impedance for external trigger, 221,
input inversion for specified channel,
insert label, 197
installed options identified, 109
instruction header, 660
instrument number, 106
instrument options identified, 109
instrument requests service, 118
instrument serial number, 157
instrument settings, 246
instrument status, 52
instrument type, 106
integrate math function, 230, 237,
INTegrate source for function, 242,
INTERN files, 216
internal low-pass filter, 192, 220
introduction to :ACQuire commands,
introduction to :CALibrate commands,
introduction to :CHANnel commands,
introduction to :DISPlay commands,
introduction to :EXTernal commands,
introduction to :FUNCtion commands,
introduction to :HARDcopy commands,
introduction to :MARKer commands,
introduction to :MEASure commands,
introduction to :RECall commands,
introduction to :SAVE commands,
introduction to :SBUS commands,
introduction to :SYSTem commands,
introduction to :TIMebase commands,
introduction to :TRIGger commands,
introduction to :WAVeform commands,
introduction to common (*) commands,
introduction to root (:) commands,
invert graticule colors for hardcopy, 251,
invert graticule colors for image,
inverted masks, bind levels, 344
inverting input for channels, 196
IO library, referencing, 44
IP address, 33
IP Options softkey, 34
K
key disable, 395
key press detected in Standard Event Status
Register, 105
knob disable, 395
known state, 111
L
label, 568
LABel commands, 543
label list, 197, 214
labels, 197, 213, 214
labels to store calibration information,
labels, specifying, 208
LAN interface, 33, 36
LAN Settings softkey, 34
landscape layout for hardcopy, 252
Agilent InfiniiVision 5000 Series Oscilloscopes Programmer's Guide
574 language for program examples,
196 LaserJet, 579
layout for hardcopy,
leakage into peak spectrum,
learn string, 107,
least significant byte first,
left reference,
legal values for channel offset,
legal values for frequency span,
legal values for offset, 236,
LENGth commands,
length for waveform data,
521 less than qualifier,
576 less than time, 435, 438, 447,
LESSthan commands,
LEVel commands,
163 level for trigger voltage, 441,
179 LF coupling, 440
190 license information,
208 limits for line number,
218 LIN acknowledge,
230 LIN baud rate,
246 LIN identifier,
257 LIN serial decode bus parity bits,
272 LIN source, 466
351 LIN standard,
358 LIN sync break,
374 LIN trigger, 469
391 LIN trigger commands,
400 LIN trigger definition,
411 line glitch trigger source,
502 line number for TV trigger,
99 line terminator,
124 LINE trigger level,
583 LINE trigger source,
364 list of channel labels,
load utilization (CAN),
local lockout,
lock, 395
LOCK commands,
lock mask to signal,
lock, analog channel protection,
lockout message,
long form, 660
lower threshold,
lower threshold voltage for measurement,
lowercase characters in commands,
low-frequency reject filter,
low-pass filter used to limit bandwidth, 192,
220
LRN (Learn Device Setup),
lsbfirst, 507
M
magnitude of occurrence,
main sweep range,
182
main time base,
main time base mode,
making measurements,
MAN option for probe sense, 571,
manual cursor mode,
41
252
244
397
507
405
198
243
239
544
371
450
451
544
544
448
109
480
464
465
463
382
467
468
462
612
452
480
92
441
444
214
379
395
544
335
396
395
287
585
659
442
107
304
408
609
402
272
575
258
MARKer commands, 256
marker mode, 264
marker position, 265
marker readout, 591, 592
marker set for voltage measurement, 597,
marker sets start time, 588
marker time, 587
markers for delta voltage measurement,
markers track measurements, 296
markers, command overview, 257
markers, mode, 258
markers, time at start, 592
markers, time at stop, 591
markers, X delta, 263
markers, X1 position, 259
markers, X1Y1 source, 260
markers, X2 position, 261
markers, X2Y2 source, 262
markers, Y delta, 266
markers, Y1 position, 264
markers, Y2 position, 265
mask, 102, 115, 419, 436
MASK commands, 544
mask statistics, reset, 329
mask test commands, 318
Mask Test Event Enable Register
(MTEenable), 141
mask test event event register, 143
Mask Test Event Event Register
(:MTERegister[:EVENt]), 143,
mask test output, 336
mask test run mode, 337
mask test termination conditions,
mask test, enable/disable, 334
mask, delete, 333
mask, get as binary block data, 332
mask, load from binary block data,
mask, lock to signal, 335
mask, recall, 354
mask, save, 366
masks, bind levels, 344
master summary status bit, 118
math function, stop displaying, 130
math operations, 230
MAV (Message Available), 101, 116,
maximum duration, 434, 435, 447
maximum position, 403
maximum range for zoomed window,
maximum scale for zoomed window,
maximum vertical value measurement,
maximum vertical value, time of, 316,
MEASure commands, 267
measure overshoot, 285
measure period, 287
measure phase between channels,
measure preshoot, 289
measure start voltage, 597
measure stop voltage, 598
measure value at a specified time,
measure value at top of waveform,
measurement error, 272
measurement setup, 272, 297
Index
598
596
644
337
332
118
409
410
309
589
288
314
315
781