Multiple Smu Connections - Tektronix KEITHLEY SourceMeter 2606B Reference Manual

Section 5: Sourcing and measuring

Multiple SMU connections

Connecting two 2606B channels in parallel or in series may result in voltages or power levels
that exceed the safety mechanisms. This increases the risk of instrument damage and the
possibility of personal injury or death due to electric shock. The user assumes all of the
associated risks of combining the outputs of two or more 2606B channels.
Connections to LO on the 2606B are not necessarily at 0 V. Hazardous voltages could exist
between LO and chassis ground. Make sure that high-voltage precautions are taken
throughout the test system. Alternatively, limit hazardous levels by adding external
protection to limit the voltage between LO and chassis. Failure to make sure high-voltage
precautions are used throughout the test system or a failure to limit hazardous levels could
result in severe personal injury or death from electric shock.
Carefully consider and configure the appropriate output-off state, source function, and
compliance limits before connecting the 2606B to a device that can deliver energy (for
example, other voltage sources, batteries, capacitors, solar cells, or other 2606B
instruments). Configure recommended instrument settings before making connections to the
device. Failure to consider the output-off state, source, and compliance limits may result in
damage to the instrument or to the device under test (DUT).
The following figures illustrate using three channels to test the same 3-terminal N-channel JFET
device. The third channel is connected to the source (S) terminal of the JFET. This allows the source
terminal to be biased above signal LO. Setting this SMU to output 0 V effectively connects the source
terminal of the JFET to signal LO.
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Model 2606B System SourceMeter® Instrument Reference Manual
2606B-901-01 Rev. C November 2021