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Table 1.3.1 Description of the 32170 Pin Function (4/6)
Type
Pin Name Signal Name
TXD1
RXD1
TXD2
RXD2
TXD3
RXD3
TXD4
RXD4
TXD5
RXD5
Real-time
RTDTXD
debugger
RTDRXD
RTDCLK
RTDACK
Flash
FP
-only
CAN
CTX
CRX
JTAG
JTMS
JTCK
JTRST
JTDI
JTDO
Input/Output Function
Transmit data Output
Receive data
Input
Transmit data Output
Receive data
Input
Transmit data Output
Receive data
Input
Transmit data Output
Receive data
Input
Transmit data Output
Receive data
Input
Transmit data Output
Receive data
Input
Clock input
Input
Acknowledge
Output
Flash Protect
Input
Data output
Output
Data input
Input
Test mode
Input
clock
Input
Test reset
Input
Serial input
Input
Serial output
Output
1-15
Transmit data output pin for serial I/O channel 1.
Receive data input pin for serial I/O channel 1.
Transmit data output pin for serial I/O channel 2.
Receive data input pin for serial I/O channel 2.
Transmit data output pin for serial I/O channel 3.
Receive data input pin for serial I/O channel 3.
Transmit data output pin for serial I/O channel 4.
Receive data input pin for serial I/O channel 4.
Transmit data output pin for serial I/O channel 5.
Receive data input pin for serial I/O channel 5.
Serial data output pin for the real-time debugger.
Serial data input pin for the real-time debugger.
Serial data transmit/receive clock input pin for the
real-time debugger.
This pin outputs a low pulse synchronously with the beginning
clock of the real-time debugger's serial data output word. The
duration of this low pulse indicates the type of command/data
that the real-time debugger has received.
This mode pin has a function to protect the flash
memory against E/W in hardware.
This pin outputs data from the CAN module.
This pin is used to input data to the CAN module.
Test mode select input to control state transition of the
test circuit.
Clock input for the debug module and test circuit.
Test reset input to initialize the test circuit
asynchronously.
This pin is used to input test instruction code or test
data serially.
This pin outputs test instruction code or test data
serially.
OVERVIEW
1.3 Pin Function
Ver.0.10
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