Performance Specifications - Agilent Technologies 1100 Series Reference Manual

Diode array and multiple wavelength detectors
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Specifications

Performance Specifications

Table 50
Performance Specifications Agilent 1100 Series DAD and MWD
Type
Detection type
Light source
Wavelength range
Short term noise
(ASTM)
Single and
Multi-Wavelengt
Drift
Linear absorbance
range
Wavelength accuracy
Wavelength bunching
Slit width
Diode width
Flow cells
296
Specification
1024-element photodiode array
Deuterium and tungsten lamps
190 – 950 nm
-5
± 1 × 10
AU at 254 and 750 nm
-3
2 × 10
AU/hr at 254 nm
> 2 AU (upper limit)
± 1 nm
1 – 400 nm
1, 2, 4 , 8, 16 nm
< 1 nm
Standard: 13 µl volume, 10 mm cell
path length and 120 bar (1760 psi)
pressure maximum
Semi-Micro: 5 µl volume, 6 mm cell
path length and 120 bar (1760 psi)
pressure maximum
High pressure: 1.7 µl volume, 6 mm cell
path length and 400 bar (5880 psi)
pressure maximum
500 nano: 0.5 µl volume, 10 mm cell
path length and 50 bar (725 psi)
pressure maximum
Comments
See "" on page 297
See "" on page 297
See "" on page 297
Self-calibration with deuterium lines,
verification with holmium oxide filter
Programmable in steps of 1 nm
Programmable slit
See
"Optimization Overview"
page 31
1100 Series DAD and MWD Reference Manual
on

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