Dark-Current Test - Agilent Technologies 1100 Series Reference Manual

Diode array and multiple wavelength detectors
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Dark-Current Test

The dark-current test measures the leakage current from each diode. The test
is used to check for leaking diodes which may cause non-linearity at specific
wavelengths. During the test, the slit assembly moves to the dark position,
cutting off all light falling onto the diode array. Next, the leakage current from
each diode is measured, and displayed graphically (see
current (represented in counts) for each diode should fall within the limits
(red bands) shown in the plot (see
Figure 26
Dark-Current Test Evaluation
Figure 27
1100 Series DAD and MWD Reference Manual
Dark-Current Test
Dark-Current Test Results
Troubleshooting and Test Functions
Figure
26).
Figure
26). The leakage
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