Performance Specifications - Agilent Technologies G1315B User Manual

Agilent 1200 series diode array and multiple wavelength detectors
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2
Site Requirements and Specifications

Performance Specifications

Table 2
Performance Specifications Agilent 1200 Series DAD and MWD
Type
Detection type
Light source
Wavelength range
Short term noise (ASTM)
Single and Multi-Wavelengt
Drift
Linear absorbance range
Wavelength accuracy
Wavelength bunching
Slit width
Diode width
Flow cells
Control and data evaluation
Analog outputs
26
Specification
1024-element photodiode array
Deuterium and tungsten lamps
190 – 950 nm
-5
± 1 × 10
AU at 254 and 750 nm
-3
2 × 10
AU/hr at 254 nm
> 2 AU (upper limit)
± 1 nm
1 – 400 nm
1, 2, 4 , 8, 16 nm
< 1 nm
Standard: 13 µl volume, 10 mm cell path length
and 120 bar (1760 psi) pressure maximum
Semi-Micro: 5 µl volume, 6 mm cell path length
and 120 bar (1760 psi) pressure maximum
Micro: 2 µl volume, 3 mm cell path length and
120 bar (1760 psi) pressure maximum
High pressure: 1.7 µl volume, 6 mm cell path
length and 400 bar (5880 psi) pressure maximum
80 nano: 0.08 µl volume, 10 mm cell path length
and 50 bar (725 psi) pressure maximum
500 nano: 0.5 µl volume, 10 mm cell path length
and 50 bar (725 psi) pressure maximum
Agilent ChemStation for LC
Recorder/integrator: 100 mV or 1 V, output range
0.001 – 2 AU, two outputs
Comments
See on page 27
See on page 27
See on page 27
Self-calibration with deuterium lines,
verification with holmium oxide filter
Programmable in steps of 1 nm
Programmable slit
See
"Optimization Overview"
page 69
1200 Series DAD and MWD User Manual
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