Agilent Technologies 1100 Series Reference Manual page 293

Diode array and multiple wavelength detectors
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Control Module Screens for Agilent 1100 DAD and MWD
7
Use the F6 key (Plot) to view the signal. A simulated chromatogram (4 peaks)
will repeat until the run is stopped. The signal is also available on the analog
output. A change of the peak width will change the retention times.
Slit Test
Use the F3 key (Slit Test) to test the movement of the electromechanical slit
assembly.
1100 Series DAD and MWD Reference Manual
293

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