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ARM9TDMI
Technical reference manual
Test Issues - ARM ARM9TDMI Technical Reference Manual
General-purpose microprocessors
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Chapter 6
Test Issues
ARM DDI0145B
This chapter examines the test issues for the ARM9TDMI and lists the scan chain 0
bit order under the headings:
•
About testing on page 6-2.
•
Scan chain 0 bit order on page 6-3.
Copyright © 1998, 1999 ARM Limited. All rights reserved.
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