Keithley 6430 Instruction Manual page 348

17-38 SCPI Command Reference
FAIL:SMLocation <NRf> | NEXT
PASS:SMLocation <NRf> | NEXT
:CALCulate2:CLIMits:FAIL:SMLocation <NRf> | Next
:CALCulate2:CLIMits:PASS:SMLocation <NRf> | Next
Parameters
Query
Description
:BCONtrol <name>
:CALCulate2:CLIMits:BCONtrol <name>
Parameters
Query
Description
<NRf> = 1 to 100
NEXT
:SMLocation?
While using a Source Memory Sweep when performing limit tests, the
sweep can branch to a specified memory location point or proceed to the
next memory location in the list.
When a memory location is specified with PASS, the sweep will branch to
that memory location if the test is successful (PASS condition). If not suc-
cessful (FAIL condition), the sweep proceeds to the next memory location
in the list. With NEXT selected (the default), the sweep proceeds to the next
memory location (present location + 1) in the list regardless of the outcome
of the test (PASS or FAIL condition).
When a memory location is specified with FAIL, the sweep will branch to
that location on a failure. If not (PASS condition), the sweep proceeds to the
next memory location in the list. With NEXT selected (the default), the
sweep proceeds to the next memory location (present location + 1) in the list
regardless of the outcome of the test (FAIL or PASS condition). Note that
branch on FAIL is available only via remote.
See Section 9, Source memory sweep for more information.
<name> = IMMediate
END
:BCONtrol?
This command is used to control when the digital output will update to the
"pass" or "fail" bit pattern. The "pass" or "fail" bit pattern tells the handler
to stop the testing process and place the DUT in the appropriate bin.
With IMMediate selected, the digital output will update immediately to the
bit pattern for the first failure in the testing process. If all the tests pass, the
output will update to the "pass" bit pattern.
With END selected, the digital output will not update to the "pass" or "fail"
bit pattern until the SourceMeter completes the sweep or list operation. This
allows multiple test cycles to be performed on DUT. With the use of a scan-
ner card, multi-element devices (i.e. resistor network) can be tested. If, for
example, you didn't use END and the first element in the device package
passed, the "pass" bit pattern will be output. The testing process will stop
and the DUT will be binned. As a consequence, the other elements in the
device package are not tested.
Specify "fail" source memory location
Specify "pass" source memory location
Specify memory location point
Next memory location point in list
(present location + 1)
Query "pass" or "fail" source memory location
Control Digital I/O port pass/fail update
Update output when first failure occurs
Update output after sweep is completed
Query when digital output will update