Figure - Keithley 6430 Instruction Manual

Table 1-7
Rel, filter, and limit configuration menus
Configuration menu item
CONFIG REL
CONFIG FILTER
AUTO FILTER
DISABLE
ENABLE
CONFIG LIMIT
CONFIGURE LIMITS MENU
DIGOUT
SIZE
3-BIT
4-BIT
16-BIT
MODE
GRADING
IMMEDIATE
END
SORTING
AUTO CLEAR
DISABLE
ENABLE
H/W LIMITS
CONTROL
DISABLE
ENABLE
FAIL MODE
IN
OUT
S/W LIMITS
CONTROL
DISABLE
ENABLE
LOLIM
HILIM
PASS
PASS
DIGIO PATTERN
SRC MEM LOC
NEXT
LOCATION#
EOT MODE
BUSY
/BUSY
EOT
/EOT
Description
Program REL value.
Configure filter.
Enable/disable auto filter.
Configure limit tests.
Program Digital I/O bit patterns for pass/fail.
Select I/O number of bits.
3-bit size
4-bit size
16-bit size (2499-DIGIO option only).
Select Digital I/O mode.
Pass if within HI/LO limits.
Stop test after first failure.
Stop test at end of sweep.
Fail if outside limits, program fail pattern.
Enable/disable auto clear.
Disable auto clear.
Enable auto clear, program pass/fail pattern.
Control and set fail mode for Limit 1 (compliance) test.
Control Limit 1 test.
Disable Limit 1 test.
Enable Limit 1 test.
Select Limit 1 fail mode.
Fail when in compliance, program bit pattern.
Fail when out of compliance, program bit pattern.
Control LIM2, 3, 5-12 tests limits and bit patterns.
Enable/disable limit tests.
Disable test.
Enable test.
Set low limit.
Set high limit.
Set pass Digital I/O bit pattern.
Set limit test pass conditions.
Set pass conditions Digital I/O bit pattern.
Set pass conditions next source memory location.
Use next location.
Specify location number.
Set Digital I/O line 4 to act as EOT or BUSY signal.
Set line 4 HI while unit is busy (3-bit mode).
Set line 4 LO while unit is busy (3-bit mode).
Output line 4 HI pulse at end of test (3-bit mode).
Output line 4 LO pulse at end of test (3-bit mode).
Getting Started 1-29