Keithley 6430 Instruction Manual page 186

9-10 Sweep Operation
Testing process — The test uses seven SMLs (source memory locations). However, only
four memory locations are used for each tested diode. If the diode is installed correctly, tests at
locations 001, 002, 003, and 004 are performed. If the diode is installed backwards, tests at
locations 001, 005, 006, and 007 are performed. To sweep four memory locations, the sweep
count must be set to four. The source memory sweep is summarized as follows:
SML 001 — Compliance Test
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SML 002 — Forward Voltage Test
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SML 003 — Reverse Breakdown Test
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SML 004 — Leakage Current Test
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SML 005 — Forward Voltage Test
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SML 006 — Reverse Breakdown Test
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Limit 1 test – Fail if in compliance, branch to source memory location 005 for "pass"
condition.
Summary – Limit 1 test is configured such that if the diode is installed correctly in the
test fixture, it will fail the compliance test and operation will proceed to the tests at
memory locations 002, 003, and 004. If the diode is installed backwards, it will pass the
compliance test, and operation will branch around locations 002, 003, and 004 to per-
form the tests at locations 005, 006, and 007. Source Memory Location 002 - Forward
Voltage Test (diode installed correctly).
Source I, Measure V.
Limit 2 test – Min/max limits for voltage reading.
Summary – The voltage measurement and the result of the test (pass or fail) is stored in
the buffer.
Source -I, Measure V.
Limit 2 test – Min/max limits for voltage reading.
Summary – The voltage measurement and the result of the test (pass or fail) is stored in
the buffer.
Source -V, Measure I.
Limit 2 test – Min/max limits for current reading.
Summary – The current measurement and the result of the test (pass or fail) is stored in
the buffer.
Source -I, Measure V.
Limit 2 test – Min/max limits for voltage reading.
Summary – This test is the same as the test at memory location 002, except the source
current is reversed to properly bias the diode that was installed backwards.
Source +I, Measure V.
Limit 2 test – Min/max limits for voltage reading.
Summary – This test is the same as the test at memory location 003, except the source
current is reversed to properly bias the diode that was installed backwards.