Figure 14-6 Measurement Event Status - Keithley 6430 Instruction Manual

Figure 14-6
Measurement event status
—
stat:meas:cond?
(B15)
—
stat:meas?
(B15)
OR
To Measurement
Summary Bit
(OSB) of Status
Byte Register
(Figure 14-3)
—
stat:meas:enab <NRF>
stat:meas:enab?
(B15)
Comp OVP OT INT
(B14) (B13) (B12) (B11) (B10)
Comp OVP OT INT
(B10)
(B11)
(B14) (B13) (B12)
&
&
&
&
Comp OVP OT INT
(B10)
(B14) (B13) (B12) (B11)
Comp = In Compliance
OVP = Over Voltage Protection
OT = Over Temperature
INT = Interlock Asserted
BFL = Buffer Full
BAV = Buffer Available
ROF = Reading Overflow
RAV = Reading Available
LP = Limits Pass
BFL BAV ROF RAV LP HL3
(B9) (B8) (B7) (B6) (B5) (B4)
BFL BAV ROF RAV LP HL3
(B9)
(B8) (B7) (B6) (B5) (B4)
&
&
&
&
&
&
BFL BAV ROF RAV LP HL3
(B9) (B8) (B7) (B6) (B5) (B4)
HL3 = High Limit 3
LL3 = Low Limit 3
HL2 = High Limit 2
LL2 = Low Limit 2
L1 = Limit 1
& = Logical AND
OR = Logical OR
Status Structure
LL3 HL2 LL2 L1 Measurement
(B3) (B2) (B1) (B0) Condition Register
LL3 HL2 LL2 L1 Measurement Event
Register
(B3) (B2) (B1) (B0)
&
&
&
&
LL3 HL2 LL2 L1
Measurement Event
(B3) (B2) (B1) (B0) Enable Register
14-15