Keithley 6430 Instruction Manual page 233

Sub-femtoamp remote sourcemeter
Hide thumbs Also See for 6430:
Table of Contents

Advertisement

Pass condition
For this discussion, assume that all grading mode limit tests pass. After the three limit tests
pass, the "PASS" message is displayed, and operation drops down to the Binning Control deci-
sion block. (Note that the pass condition can also be determined with the
:CALC2:LIM<n>FAIL? query via remote.)
Immediate binning — For immediate binning, the testing process stops. The SourceMeter
outputs the pass pattern to the component handler to perform the binning operation.
End binning — For end binning, operation drops down to the Another Test Cycle? decision
block. If programmed to perform additional tests (i.e., sweep) on the DUT package, operation
loops back up to perform the next source-measure action. After all programmed test cycles are
successfully completed, the SourceMeter outputs the pass pattern to the component handler to
perform the binning operation.
If configured to test another DUT package, operation loops back to the top of the flowchart
and waits for the SOT (start of test) pulse from the component handler.
Fail condition
When a failure occurs, the FAIL message is displayed (and also can be read via remote with
:CALC2:LIM<n>FAIL?), and operation proceeds to the Binning Control decision block.
Immediate binning — For immediate binning, the testing process is terminated and the fail
pattern for that particular failure is sent to the component handler to perform the binning
operation.
End binning — For end binning, the fail pattern for the first failure is stored in memory and
operation proceeds to the Another Test Cycle? decision block. If programmed to perform addi-
tional tests (i.e., sweep) on the DUT package, operation loops back up to perform the next
source-measure action. Note that when a failure occurs, subsequent tests in the test cycle are
not performed.
After all programmed test cycles are completed, the SourceMeter outputs the fail pattern
stored in memory. This reflects the first failure that occurred in the testing process for the
device package. The component handler places the DUT in the appropriate bin.
If configured to test another DUT package, operation loops back to the top of the flowchart
and waits for the SOT (start-of-test) pulse from the component handler.
Limit Testing
11-7

Advertisement

Table of Contents
loading

Table of Contents