H3C SR6600 Command Reference Manual page 37

Network management and monitoring command reference
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Field
Max negative SD
Max negative DS
Negative SD number
Negative DS number
Negative SD sum
Negative DS sum
Negative SD average
Negative DS average
Negative SD square sum
Negative DS square sum
One way results
Max SD delay
Max DS delay
Min SD delay
Min DS delay
Number of SD delay
Number of DS delay
Sum of SD delay
Sum of DS delay
Square sum of SD delay
Square sum of DS delay
SD lost packet(s)
DS lost packet(s)
Lost packet(s) for unknown reason
Voice scores
Max MOS value
Min MOS value
Max ICPIF value
Min ICPIF value
Reaction statistics
Index
Checked Element
Description
Maximum absolute value among negative jitters from source to
destination.
Maximum absolute value among negative jitters from destination to
source.
Number of negative jitters from source to destination.
Number of negative jitters from destination to source.
Sum of absolute values of negative jitters from source to destination.
Sum of absolute values of negative jitters from destination to source.
Average absolute value of negative jitters from source to
destination.
Average absolute value of negative jitters from destination to
source.
Square sum of negative jitters from source to destination.
Square sum of negative jitters from destination to source.
Uni-direction delay test result, displayed on in a UDP Jitter or voice
test.
Maximum delay from source to destination.
Maximum delay from destination to source.
Minimum delay from source to destination.
Minimum delay from destination to source.
Number of delays from source to destination.
Number of delays from destination to source.
Sum of delays from source to destination.
Sum of delays from destination to source.
Square sum of delays from source to destination.
Square sum of delays from destination to source.
Number of lost packets from the source to the destination.
Number of lost packets from the destination to the source.
Number of lost packets for unknown reasons.
Voice parameters, displayed only in a voice test.
Maximum MOS value.
Minimum MOS value.
Maximum ICPIF value.
Minimum ICPIF value.
Statistics about the reaction entry in the counting interval.
ID of a reaction entry.
Monitored element.
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