Diode Array Detector (Dad); Self-Test - Agilent Technologies 1220 Infinity II LC User Manual

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Diode Array Detector (DAD)

This chapter describes the detector's built in test functions.

Self-test

The DAD self-test (see
and evaluates the results automatically. The following tests are run:
• Filter Test
• Slit Test
• Dark Current Test
• Intensity Test
• Wavelength Calibration Test
• Holmium Test
• Spectral Flatness Test
• ASTM Noise Test (optional)
The self-test can be run once or repetitively. When set up to run repetitively,
the tests run in series continually until stopped by the user. Running the test
repetitively is useful when troubleshooting problems which occur
intermittently.
The ASTM noise test determines the detector baseline noise (254 nm) while
pumping water at 1 mL/min. The test requires approximately 20 minutes to
run, and can be included or excluded from the self-test sequence as required.
Setup of the self test is done in the Self Test dialog box. Select either Single
Test or Repetitive Tests. Check the ASTM Noise Test checkbox to include the
noise test in the self test.
1220 Infinity II LC System User Manual
Figure 51
on page 172) runs a series of individual tests,
Test Functions and Calibration

Diode Array Detector (DAD)

9
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