IBM pSeries 670 Service Manual page 647

Error Code Description
4506 25F9 Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
4506 269A Fault in L3 VPD card used with 1.5 GHz and
1.7 GHz MCMs
4506 28B0 Memory subsystem and scan interface basic
assurance tests detected fault in I/O subsystem
PCI backplane
4506 28B1 Memory subsystem and scan interface basic
assurance tests detected fault in I/O subsystem
DASD backplane
4506 302A Memory subsystem and scan interface basic
assurance tests detected fault in 8 GB memory
book (inner)
4506 302B Memory subsystem and scan interface basic
assurance tests detected fault in 8 GB memory
book (outer)
4506 302C Memory subsystem and scan interface basic
assurance tests detected fault in 32 GB
memory book (inner)
4506 302D Memory subsystem and scan interface basic
assurance tests detected fault in 32 GB
memory book (outer)
4506 305A Memory subsystem and processor subsystem
tests detected fault in 8 GB memory book
(inner)
4506 305B Memory subsystem and processor subsystem
tests detected fault in 8 GB memory book
(outer)
4506 305C Memory subsystem and scan interface basic
assurance tests detected fault in 4 GB inner
memory book
4506 305D Memory subsystem and scan interface basic
assurance tests detected fault in 4 GB outer
memory book
4506 305E Memory subsystem and scan interface basic
assurance tests detected fault in 16 GB inner
memory book
4506 305F Memory subsystem and scan interface basic
assurance tests detected fault in 16 GB outer
memory book
4506 307A Memory subsystem and processor subsystem
tests detected fault in 4 GB inner memory book
4506 307B Memory subsystem and processor subsystem
tests detected fault in 8 GB inner memory book
4506 307C Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
4506 307D Memory subsystem and processor subsystem
tests detected fault in 16 GB inner memory
book
Action/
Possible Failing FRU
Go to "MAP 1548: Memory and Processor
Problem Isolation" on page 290.
Go to "MAP 1548: Memory and Processor
Problem Isolation" on page 290.
I/O subsystem PCI backplane at location
specified in error code
I/O subsystem DASD backplane at location
specified in error code
Go to "MAP 1540: Problem Isolation
Procedures" on page 253 to isolate the failing
component.
Go to "MAP 1540: Problem Isolation
Procedures" on page 253 to isolate the failing
component.
Go to "MAP 1540: Problem Isolation
Procedures" on page 253 to isolate the failing
component.
Go to "MAP 1540: Problem Isolation
Procedures" on page 253 to isolate the failing
component.
Go to "MAP 1544: Inner L3 Module Problem
Isolation" on page 282.
Go to "MAP 1545: Outer L3 Module Problem
Isolation" on page 284.
Go to "MAP 1544: Inner L3 Module Problem
Isolation" on page 282.
Go to "MAP 1545: Outer L3 Module Problem
Isolation" on page 284.
Go to "MAP 1544: Inner L3 Module Problem
Isolation" on page 282.
Go to "MAP 1545: Outer L3 Module Problem
Isolation" on page 284.
Go to "MAP 1544: Inner L3 Module Problem
Isolation" on page 282.
Go to "MAP 1544: Inner L3 Module Problem
Isolation" on page 282.
Go to "MAP 1544: Inner L3 Module Problem
Isolation" on page 282.
Go to "MAP 1544: Inner L3 Module Problem
Isolation" on page 282.
Chapter 5. Error Code to FRU Index
627