Keysight Technologies 33210A User Manual page 322

5 Error Messages
619 to 621
623 to 625
619: Sel f-test failed; lead ing edge DAC
620: Sel f-test failed; trailing edge DAC
621: Sel f-test failed; square-wave threshold DAC
623: Sel f-test failed; dc offset DAC
624: Sel f-test failed; null DAC
625: Sel f-test failed; amplitude DAC
These errors indicate a malfunctioning system DAC, failed DAC multiplexer
channels, or associated circuitry.
622
Sel f-test failed; time base calibration DAC
This error indicates that the time base calibration DAC in the synthesis IC, or
voltage controlled oscillator, has failed.
626 to 629
626: Sel f-test failed; waveform filter path select relay
627: Sel f-test failed; -10 dB attenuator path
628: Sel f-test failed; -20 dB attenuator path
629: Sel f-test failed; +20 dB amplifier path
These errors indicate that the specified relay is not being properly switched or the
attenuator / amplifier is not providing the expected attenuation or gain. These
self-tests use the internal ADC to verify that the output path relays, output
amplifier (+20 dB), and output attenuators are operating properly.
630
Sel f-test failed; internal ADC over-range cond ition
This error indicates a probable ADC failure. The failure could be of the system
ADC, the ADC input multiplexer, or the ADC input buffer amplifier.
631
Sel f-test failed; internal ADC measurement error
This error indicates a probable ADC failure. The failure could be of the system
ADC, the ADC input multiplexer, or the ADC input buffer amplifier.
322 Keysight 33210A User's Guide