Agilent Technologies 8453 Operator's Manual page 507

11
Evaluating System Suitability
Sequence Summary Reporting
• peak height,
• peak width at half height,
• peak symmetry,
• peak tailing,
• capacity factor (k´),
• plate numbers,
• resolution between peaks,
• selectivity relative to preceding peak,
• skew, and
• excess.
The mean value, the standard deviation, the relative standard deviation and
the confidence interval are calculated. You can set limits for either standard
deviation, the relative standard deviation or the confidence interval for each
of these parameters. Should the values exceed your limits, the report is
flagged to draw your attention to them.
The quality of the analytical data can be supported by keeping records of the
actual conditions at the time the measurements were made. The
ChemStation's logbook records instrument conditions before and after a run.
This information is stored with the data and reported with sample data.
Instrument performance curves are recorded during the entire analysis as
signals, and stored in the data file. If supported by the instrument these
records, overlaid on the chromatogram, can be recalled on demand, for
example, during an audit.
Baseline noise and drift can be measured automatically. A minimum
detectable level can be calculated from peak height data for each calibrated
compound in the method.
Finally, instrument configuration, instrument serial numbers,
column/capillary identification, and your own comments can be included in
each report printed.
Extended performance results are calculated only for compounds calibrated
for in the method, ensuring characterization by retention/migration times and
compound names.
Understanding Your Agilent ChemStation 233