Agilent Technologies 8453 Operator's Manual page 269

cabinet, 26
connections, 62
events, 43
internal memory
exchanging, 118
upgrading, 118
isopropanol, 102, 103
isopropyl alcohol, 102, 103
K
key pad, 116
exchanging, 116
removing, 116
replacing, 116
keyboard, 112, 116
exchanging, 116
removing, 116
replacing, 116
keyboard cable
removing, 109
kinetics measurements, 118
L
lamps, 19
access through door, 25
deuterium, 19, 40, 47, 96
do not ignite, 96
fixing, 99
lifetime, 98
mercury, 47
tungsten, 19, 40, 96
zinc-argon, 47
layout and construction of instrument,
26
lens, 19, 21
lenses
cleaning, 103
photographic, 102, 104
lifetime of lamp, 98
light emission of deuterium lamp, 40
light pipe, 133, 134
removing, 134
line centroids, 48
line frequency, 11
line power
input socket, 25
switch, 22
line voltage, 11
Index
lock mechanism, 96
logarithm of intensity spectrum, 46
logic true, 50
low-pass filter, 38, 42
LPS board, 120, 121
M
main microprocessor, 35
main power supply, 32
block diagram, 32
connector, 63
exchanging, 133
removing, 133
replacing, 134
reset, 33
maintenance, 94
procedures, 94
materials, 138
measure push buttons, 23
memory, 36
exchanging, 118
non-volatile random access, 35
program, 35
system, 35
upgrading, 118
mercury lamp, 47
metal
front cover, 111
internal cabinet, 26
lamp door, 96, 99
microprocessor, 35
system, 43
MIO board
control, 43
removing, 118, 120
slot, 25
mode select, 146
multicell transport
connector, 24, 57
multichannel pump-GPIO cable, 53
N
NIST 2034 standard, 12, 14
NIST 930e standard, 12, 14
noise, 13
nominal spectral slit width, 21
non-volatile random access memory
(NVRAM), 35, 146
NVRAM, 35
O
offset correction, 35
open collector type, 50
operating
altitude, 11
temperature, 11
optical system, 19
optical tissue, 98
optical unit, 122
exchanging, 122
removing, 122
replacing, 123
overload, 32
overtemperature sensor, 33
overview
of electronics, 29
of optical system, 19
P
parity settings, 149
parts, 138
breakdown, 139, 141
front cover, 142
list, 138
numbers, 138
PDA (photodiode array), 38
front end processor (PFP), 38
signal conditioning electronics, 38
performance specifications, 12
peripherals
connections to, 50
peristaltic pump, 51
personal computers, 10
photodiode array, 21, 30, 38, 45
quantum efficiency, 45
temperature compensation, 35
photographic lenses, 102, 104
cleaning brush, 102, 104, 105
photometric
accuracy, 12
noise, 13
stability, 13
physical specifications, 11
plasma discharge, 19
plastic
door, 25
163