Agilent Technologies 8453 Operator's Manual page 270

external cabinet, 26
front cover, 109, 112
lamp door, 96, 99
potassium dichromate, 12
power button, 134
power consumption, 11
power supply cable, 63
program memory, 35
pulse width modulation driver (PWM),
35
pump connector, 51, 52, 53
push buttons, 23
blank, 23
sample, 23
standar, 23
stop, 23
Q
quantum efficiency of the photodiode
array, 45
quartz envelope, 98
R
radiated frequency interference (RFI),
38
radiation source, 19
radio frequency emissions, 26
random access memory, non-volatile,
35
range of wavelengths, 12
raw data, 45
conversion to absorbance, 43
flow from photodiode array, 43
real-pass band function, 48
real-time clock, 35
rear cover
removing, 113
replacing, 114
rear view of spectrophptometer, 24
recalibration, 48
remote connector, 24
removing
accessory boards, 118, 120
connectors and screws from SPM
board, 121
covers, 109
key pad, 116
keyboard, 116
Index
MIO board, 118, 120
SIMM memory modules, 118
the deuterium lamp, 96
the fan assembly, 126
the front covers, 109
the keyboard cable, 109
the light pipe, 134
the main power supply, 133
the middle rear foam block, 130
the optical unit, 122
the rear cover, 113
the sample pan, 110, 113
the SDA board, 128
the shutter assembly, 101, 124
the SLS board, 130
the SPM board, 120
the tungsten lamp, 96
repair procedures, 108
repairing the instrument, 108
replacing, 109
covers, 109
key pad, 116
keyboard, 116
SIMM memory modules, 119
the deuterium lamp, 99
the fan assembly, 126
the front covers, 111
the main power supply, 134
the middle rear foam block, 131
the optical unit, 123
the rear cover, 114
the sample pan, 111, 114
the SDA board, 129
the shutter assembly, 102, 125
the SLS board, 131
the SPM board, 121
the tungsten lamp, 99
the upper rear foam block, 121
reproducibility, 12
reset of power supply, 33
resident
EEPROM, 38
part of firmware, 43, 148
resolution, 12
RFI (radiated frequency interference),
38
ribbon cables on SDA and LPS boards,
120, 121
164
RS232C
connector, 24, 58
settings, 148
S
safety
light switches, 41
shutdown, 41
sample
compartment, 20, 110, 111, 113, 114
pan, 110, 111, 113, 114
push button, 23
sampling interval, 21
scan time, 13
SCI board, 38
SDA board, 30, 120, 121
exchanging, 128
removing, 128
replacing, 129
security lever, 25
sensor for overtemperature, 33
setting the 8-bit configuration switch,
146
sheet-metal
door, 25
rear cover, 114
shine-through aperture, 19
shortest scan time, 13
shutdown, 41
shutter, 19, 20
shutter assembly
connector, 64
exchanging, 124
removing, 101, 124
replacing, 102, 125
shutter cable, 101, 102, 120, 121, 124,
125
signal
averaging, 35
conditioning electronics, 45
level, 50
SIMM
memory module, 36
memory modules, 118, 119
socket, 118
sockets, 30
single-channel peristaltic pump, 51
sipper/sampler-GPIO cable, 51