Mitsubishi Electric MELSEC iQ-R-R00CPU User Manual page 171

Precautions
This section describes the precautions on the use of the device test with execution conditions.
■Operation when devices/labels cannot be registered
When multiple devices/labels are registered to the device test with execution conditions, none of the devices/labels are
registered if there is even one device/label or execution condition (program block, step number, or execution timing) that
cannot be registered.
■Operation from multiple engineering tools
Multiple engineering tools connected to the network can be used to register the device test with execution conditions for the
same CPU module. However, when the device tests with execution conditions are registered to the same device/label in the
same location, the status (value) that is registered later takes effect. Before executing the device test with execution
conditions from multiple engineering tools, update the data using "Update Status".
■Mutual exclusion
This section describes the mutual exclusion between the device test with execution conditions and other functions.
Other functions
Online change
Real-time monitor
Data logging
■Device range check
The following table lists the details of the device range check for each specification.
Item
Specification of device name by index
modification
Specification of device name by
indirect specification
Specification of file register
■Specification of local device
When local devices are registered to the device test with execution conditions, the write destination of the device values vary
depending on the value of SM776 (Local device setting at CALL) and SM777 (Local device setting in interrupt programs).
(Page 816 Instruction related)
■Using together with interrupt programs
When a step number in an interrupt program is specified as an execution condition of a device test with execution conditions,
the processing time of the interrupt program increases by the processing time of the device test with execution conditions.
For example, when the interrupt interval of I49 set in the parameter of "Interrupt Setting from Internal Timer" under "Fixed
Scan Interval Setting" is as short as 0.05ms and a step number in I49 is specified as an execution condition of a device test
with execution conditions, the processing time of the interrupt program may exceed the time set in "Fixed Scan Interval
Setting". Therefore, a WDT error may occur due to continuous execution of the interrupt program. For how to reduce
processing time of interrupt programs, refer to descriptions of interrupt programs. (Page 67 Interrupt Program)
Operation
When the device test with execution conditions is registered or disabled during execution of the online change, an
error occurs and registering or disabling the device test with execution conditions fails.
When execution of these functions is set for the same step as that specified by the device test with execution
conditions, the device test with execution conditions is executed first.
Description
When an index-modified device is registered to the device test with execution conditions, the device range check is
not performed. Therefore, the device value is not changed under the following conditions.
• The index-modified device is across the boundary of the device area.
• The index-modified device is out of the device range.
When an indirectly-specified device is registered to the device test with execution conditions, the device range check
is not performed. Therefore, the device value is not changed under the following conditions.
• The indirectly-specified device is across the boundary of accessible areas.
• The indirectly-specified device is out of the range accessible.
When file registers are registered to the device test with execution conditions, whether or not the register files are
assigned and the range of the file registers are not checked. Therefore, file register values are not changed under the
following conditions.
• File register files are not assigned.
• Specified device numbers of file register is out of the file register range.
10 TEST FUNCTION
10.2 Device test with execution conditions
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