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Model 6517B Electrometer Reference Manual
:TSEQuence command summary
Command
:TSEQuence
:ARM
:ABORt
:TYPE <name>
:TYPE?
:TSOurce <name>
:TSOurce?
:TLINe <NRf>
:TLINe?
:DLEakage
:STARt <NRf>
:STARt?
:STOP <NRf>
:STOP?
:STEP <NRf>
:STEP?
:MDELay <NRf>
:MDELay?
:CLEakage
:SVOLtage
<NRf>
:SVOLtage?
:SPOints <NRf>
:SPOints?
:SPINterval
<NRf>
:SPINterval?
:CIResistance
:SVOLtage
<NRf>
:SVOLtage?
:SPOints <NRf>
:SPOints?
:SPINterval
<NRf>
:SPINterval?
:TSEQuence
:RVCoefficient
6517B-901-01 Rev. C / August 2015
Description
Path to program test sequences:
Arms selected test sequence
Stops a test sequence in process
Specify test; DLEakage, CLEakage,
CIResistance, RVCoefficient,
SRESistivity, VRESistivity,
SIResistivity, SQSWeep,
STSWeep, ALTPolarity
Query test type
Specify trigger source; MANual,
IMMediate,
BUS, TLINk, EXTernal, LCLosure
Query trigger source
Specify TLINk line; 1 to 6
Query TLINk line
Diode leakage test path:
Specify start voltage; -1000 to 1000
Query start voltage
Specify stop voltage; -1000 to 1000
Query stop voltage
Specify step voltage; -1000 to 1000
Query step voltage
Specify measure delay; 0 to 10000.0
(sec)
Query measure delay
Capacitor leakage test path:
Specify bias voltage (-1000 to 1000)
Query bias voltage
Number points (1 to Max Buffer)
Query number of points
Interval between points: 0 to 99999.9
(sec)
Query interval
Cable insulation resistance test path:
Specify bias voltage; -1000 to 1000
Query bias voltage
Number points (1 to Max Buffer)
Query number of points
Interval between points: 0 to 99999.9
(sec)
Query interval
Resistor voltage coefficient test path:
Section 14: SCPI command reference
Default parameter
SCPI
DLEakage
MANual
1
+1 V
+10 V
+1 V
1 sec
+1 V
10
1 sec
+1 V
5
1 sec
14-29
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