Configuring Test Sequences; Configure Sequence Menu - Keithley 6517B Reference Manual

Section 6: Test sequences

Configuring test sequences

Configure sequence menu

The CONFIGURE SEQUENCE menu is used to select and configure a test sequences and is
summarized in the below table. The top level of the menu is displayed by pressing CONFIG and then
SEQ.
Configure sequence menu
Menu item
APPLICATIONS
DEV-CHAR
DIODE
LEAKAGE-CURRENT
START V
STOP V
STEP V
DELAY
CAPACITOR
LEAKAGE-CURRENT
BIAS V
STORE nnnnn READINGS
INTERVAL
CABLE
INSULATION-RESISTANCE
BIAS V
STORE READINGS
INTERVAL
RESISTOR
VOLTAGE-COEFFICIENT
SOURCE V1
DELAY 1
SOURCE V2
DELAY 2
R/RESISTIVITY
NORMAL
SURFACE
PRE-DISCH
BIAS V
BIAS-TIME
MEAS-V
MEAS-TIME
DISCHARGE
VOLUME
PRE-DISCH
BIAS V
BIAS-TIME
MEAS-V
MEAS-TIME
DISCHARGE
6-12
Description
Select type of test:
Device characterization tests:
Diode leakage current test:
Specify start voltage
Specify stop voltage
Specify step voltage
Specify delay
Capacitor leakage current test:
Specify bias voltage
Specify number of readings
Specify time interval
Cable insulation resistance test:
Specify bias voltage
Specify number of readings
Specify time interval
Resistor voltage coefficient test:
Specify 1st test voltage
Specify 1st delay
Specify 2nd test voltage
Specify 2nd delay
Resistance/resistivity tests:
Standard method resistivity tests:
Surface resistivity test:
Specify pre-discharge time
Specify bias voltage
Specify bias time
Specify measurement voltage
Specify measurement time
Specify discharge time
Volume resistivity test:
Specify pre-discharge time
Specify bias voltage
Specify bias time
Specify measurement voltage
Specify measurement time
Specify discharge time
Model 6517B Electrometer Reference Manual
Default parameter
+1 V
+10 V
+1 V
1 s
+1 V
10
1 s
+1 V
5
1 s
+1 V
1 s
+2 V
1 s
0.2 s
+500 V
1 s
+500 V
0 s
2 s
10 s
+500 V
1 s
+500 V
0 s
2 s
6517B-901-01 Rev. C / August 2015