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Section 6: Test sequences
Menu sections
APPLICATIONS
This menu item is used to select the application:
DEV-CHAR: Use this menu item to select and configure one of the device characterization tests:
DIODE: Use this option to select and configure the diode leakage current test. After
selecting LEAKAGE-CURRENT, you are prompted to enter the start voltage, stop
voltage, step voltage and the delay. After entering these test parameters, use the EXIT
key to back out of the menu structure.
CAPACITOR: Use this option to select and configure the capacitor leakage current test.
After selecting LEAKAGE-CURRENT, you are prompted to enter the bias voltage,
number of readings, and the time interval. After entering these test parameters, use the
EXIT key to back out of the menu structure.
CABLE: Use this option to select and configure the cable insulation resistance test. After
selecting INSULATION-RESISTANCE, you are prompted to enter the bias voltage,
number of readings, and time interval. After entering these test parameters, use the EXIT
key to back out of the menu structure.
RESISTOR: Use this option to select and configure the resistor voltage coefficient test.
After selecting VOLTAGE-COEFFICIENT, you are prompted to enter the first voltage,
first delay, second voltage, and second delay. After entering these test parameters, use
the EXIT key to back out of the menu structure.
RESISTIVITY: Use this menu item to select and configure one of the standard method resistivity tests
or the alternating polarity test:
NORMAL: Use this menu item to select and configure one of the standard method resistivity tests:
SURFACE: Use this option to select and configure the surface resistivity test. You are
prompted to enter the pre-discharge time, bias voltage, bias time, measure voltage,
measure time, and discharge time. After entering these test parameters, use the EXIT
key to back out of the menu structure.
VOLUME: Use this option to select and configure the volume resistivity test. You are
prompted to enter the pre-discharge time, bias voltage, bias time, measure voltage,
measure time, and discharge time. After entering these test parameters, use the EXIT
key to back out of the menu structure.
ALT POLARITY: Use this menu to select and configure the alternating polarity
resistance/resistivity test. You are prompted to enter the offset voltage, alternating
voltage, measure time, readings to discard, and readings to store. After entering these
test parameters, use the EXIT key to back out of the menu structure.
SIR: Use this menu item to select and configure the surface insulation resistance test. After selecting
SUR-INSUL-RES-TEST, you are prompted to enter the bias voltage, bias time, measure voltage, and
measure time. After entering these test parameters, use the EXIT key to back out of the menu
structure.
SWEEP: Use this menu item to select and configure one of the sweep tests:
SQUARE-WAVE: Use this option to select and configure the square wave sweep test.
You are prompted to enter the high level voltage, time at the high level, low level voltage,
and time at the low level. After entering these test parameters, use the EXIT key to back
out of the menu structure.
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Model 6517B Electrometer Reference Manual
6517B-901-01 Rev. C / August 2015
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