Spectrum Emission Mask Overview - Promax AE-166 User Manual

NOTE:
4.1.10

Spectrum Emission Mask Overview

Description
►
SEM measurements are used to measure the out-of-channel emissions
relative to the in-channel power. SEM measurements are usually calculated
for specified power bands at a number of different offsets to the carrier
frequency. SEM measurements are often carried out for a number of different
wireless standards.
For 3GPP, the AE-166/167 supports BS (base station) and UE (user
equipment) testing standards for both FDD (frequency-division duplexing) and
TDD (time-division duplexing) modes.
The AE-166/167 also supports SEM testing for 802.11b, 802.11g, 802.11n
and 802.16 as well as user defined emission mask testing.
Example
►
Parameters
►

ChanIntegBW: Channel Integration Bandwidth. The ChanIntegBW is used
to measure the in-channel power.

Chan Span: Used to define the span of the main channel when measuring
the channel power.

RBW: Sets the resolution bandwidth for the main channel when measuring
the in-channel power.

Total Pwr Ref: The total power of the carrier that is used as the reference
for calculating the offset power.

PSD Ref: The mean power spectral density of the carrier that is used as
the reference for calculating the offset power.
105
The phase jitter measurements are strongly tied to the RBW
and VBW.
Figure 80.
February 2017