Agilent Technologies HP 8719D Service Manual page 269

Note
The following descriptions of tests 3 and 4 apply to
instruments with ilrmware revisions 6.xx and below.
RAM.
3
CMOS
non-destructive write/read pattern. A destructive version that writes
over stored data is shown in 'lhble 10-2.
4
non-destructive write/read test pattern. A destructive version is shown
in l'hble 10-2. These tests, internal tests 2 through 4, are normally run
at preset and power-on. However, a jumper on the A7 CPU assembly,
illustrated in F'igure 10-2, can be set in one of five positions with the
following results:
Service Key Menus and Error Messages
Verifies the A7 CPU CMOS (long-term) memory with a
Verifies the A7 CPU main memory (DRAM) with a
CMOS