Test Devices - Digital Equipment 300 Series AXP Reference Manual

TEST
The
and an optional parameter, executes selected diagnostics. The
following parameters specify a device or subsystem to be tested.
A list of available devices in the system can be obtained by
issuing a
the devices and subsystems you substitute for [test_device] in the
command line.
Table 4–11 Test Devices
Parameter
asic
cxt
ferom
isdn
mem
ni
nvr
scc
scsi
tc n
4–60
command, when used with the
test
command. Table 4–11 lists the names of
show config
Function
Tests the ASIC (application-specific integrated
circuit) subsystem.
Runs the CXT (graphics) pattern test with the
user verification parameter set.
Tests to see if the Flash ROM image is correct for
the CPU, and that the expected checksums are
correct.
Tests the ISDN and audio subsystem.
Performs ECC testing of memory, as well as
detects address and data with faults.
Verifies that the LANCE chip is operational. The
diagnostic also induces "forced errors" to ensure
functionality.
Tests NVR (nonvolatile random-access memory),
and specifically ensures the integrity of the
TOY/NVR controller located on the system module.
Tests the SCC (serial communication controller
chip: keyboard, mouse) subsystem, and specifically
the data path to the SCC, and the ability to
operate in asynchronous mode.
Tests the SCSI subsystem, specifically the
controller chips, SCSI ASIC, SCSI bus, and DMA
path.
Tests the TURBOchannel option in slot n, that is,
the option installed in either slot 0 or 1. For use
on Model 300/300X/300LX systems.
parameter
test_device