Configuring And Performing Limit Tests - Keithley SourceMeter 2400 User Manual

Sourcemeter 2400 series source measure unit
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2400 Series SourceMeter
User's Manual
Configuring and performing limit tests
Configuring limit tests
Press CONFIG and then LIMIT to display the CONFIG LIMITS MENU. The limits con-
figuration menu is structured shown below and in
the primary items of the limit menu and dashes indicate the options of each menu or sub-
menu item. Refer to
DIGOUT — Use this menu item to control the following Digital I/O aspects:
SIZE — Use to select 3-BIT or 4-BIT Digital I/O bit size. In the 3-BIT mode,
Digital I/O line 4 becomes the EOT, /EOT, BUSY, or /BUSY signal depending
on the selected END OF TEST mode. In the 4-BIT mode, Digital I/O line 4 is
controlled manually if the END OF TEST mode is set to EOT.
MODE — Use to select GRADING or SORTING mode:
In GRADING mode, a reading passes if it is within all of the HI/LO limit tol-
erances enabled, assuming that it has passed the Contact Check (contact check
option only) and Compliance tests first. The Digital I/O will be driven with the
first pattern of the first Contact Check, Compliance, HI, or LO failure. Other-
wise, the pass pattern will be output. In GRADING mode, you will also
choose bin control modes. With IMMEDIATE, the testing process will stop
after the first failure and place the fail pattern on the digital output. If none of
the limit tests fail, the pass pattern will be placed on the output, and the testing
process will stop. With END, the testing process will continue until the pro-
grammed sweep is completed, regardless of how many failures occur. This
allows multi-element devices (i.e., resistor networks) to be tested. After testing
is finished, the bit pattern for the first failure is placed on the output. If all tests
pass, the pass pattern will instead be placed on the output.
In SORTING mode, a reading will fail if it fails the optional Contact Check
Test, the Compliance Test, or is not within any of the Digital I/O Bands. If the
tests pass and only Limit 1 or 4 (optional contact check test) is enabled, the
associated pass pattern will be output. Otherwise, the first limit test band that
passes will output its lower limit pattern (upper limit patterns will be ignored).
If Limit 1 or 4 fails, their failure patterns will be output. If no Limit 2, 3, or
5-12 passes, their failure pattern will be output. When SORTING is selected,
the Digital I/O bit pattern can also be set (0 to 7, 3-bit; 0 to 15, 4-bit).
AUTO CLEAR — Use this menu item to ENABLE or DISABLE auto-clear
for the digital output. After enabling auto-clear, you will be prompted to set the
pass/fail pattern pulse width (delay; 0 to 60.00000sec). You will then be
prompted to set the digital output clear pattern (0 to 7, 3-bit; 0 to 15, 4-bit).
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Figure
12-10. Note that bullets indicate
Section
1,
"Rules to navigate
menus" to configure the limit tests.
Limit Testing
12-19

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