Pass Condition - Keithley SourceMeter 2400 User Manual

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12-8 Limit Testing 2400 Series SourceMeter User's Manual

Pass condition

For this discussion, assume that all grading mode limit tests pass. After the three limit tests
pass, the "PASS" message is displayed, and operation drops down to the Binning Control
decision block. (Note that the pass condition can also be determined with the
:CALC2:LIM<n>FAIL? query via remote.)
Immediate binning — For immediate binning, the testing process stops. The SourceMe-
ter outputs the pass pattern via the Digital I/O port to the component handler to perform
the binning operation.
End binning — For end binning, operation drops down to Another Test Cycle? decision
block. If programmed to perform additional tests (i.e., sweep) on the DUT package, oper-
ation loops back up to perform the next source-measure action. After all programmed test
cycles are successfully completed, the SourceMeter outputs the pass pattern to the compo-
nent handler to perform the binning operation.
If configured to test another DUT package, the operation loops back to the top of the flow-
chart and waits for the start-of-test (SOT) pulse from the component handler.
Fail condition
When a failure occurs, the FAIL message is displayed (and also can be read via remote
with :CALC2:LIM<n>FAIL?), and operation proceeds to the Binning Control decision
block.
Immediate binning — For immediate binning, the testing process is terminated when a
failure occurs, and the fail pattern for that particular failure is sent to the component
handler to perform the binning operation. Triggering is maintained for other instruments
or components in the test system.
End binning — For end binning, the fail pattern for the first failure is stored in memory
and operation proceeds to Another Test Cycle? decision block. If programmed to
perform additional tests (i.e., sweep) on the DUT package, operation loops back up to
perform the next source-measure action.
After all programmed test cycles are completed, the SourceMeter outputs the fail pattern
stored in memory on the Digital I/O port. This reflects the first failure that occurred in the
testing process for the device package. The component handler places the DUT in the
appropriate bin.
If configured to test another DUT package, operation loops back to the top of the flowchart
and waits for the start-of-test (SOT) pulse from the component handler.
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