Auto <B> - Keithley SourceMeter 2400 User Manual

Sourcemeter 2400 series source measure unit
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2400 Series SourceMeter
User's Manual
AUTO <b>
:SOURce2:CLEar:AUTO <b>
Parameters
<b> =
Query
:AUTO?
Description
This command is used to enable or disable auto-clear for the digital out-
put lines. When enabled, the output pattern will clear automatically after
the "pass or fail" output bit pattern of a limit test is sent to a handler via
the digital output lines.
The :DELay command specifies the pulse width of the limit test bit pat-
tern. (See next command.) After the delay period times out, the digital
output clears back to the output pattern programmed by the :TTL:LEVel
command.
When auto-clear is disabled, the digital output pattern can only be
cleared by the :IMMediate command.
On power-up, auto clear is enabled.
See "CALCulate2" subsystem and
details on limit tests.
DELay <n>
:SOURce2:CLEar:AUTO:DELay <n>
Parameters
<n> =
Query
:DELay?
:DELay? DEFault
:DELay? MINimum
:DELay? MAXimum
Description
This command is used to set the delay for digital output auto-clear. This
delay determines the pulse width of the limit test output pattern as
required by the handler. After the delay, the output returns (clears) to the
pattern programmed by the :TTL:LEVel command.
The delay actually defines the pulse width for line 4, which is used by
category register component handlers as the end-of-test (EOT) strobe.
The pulse width of the other three lines are 20µsec longer (10µsec
before line 4 is toggled, and 10µsec after line 4 is cleared). Skewing the
timing on line 4 provides setup and hold time for category register com-
ponent handlers. See
timing.
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SCPI Command Reference 18-103
Control auto-clear for digital output
0 or OFF
Disable auto-clear
1 or ON
Enable auto-clear
Query auto-clear
Section
12,
"Limit
Set delay for auto-clear
0 to 60
Specify delay (in seconds)
DEFault
100µsec delay
MINimum
0 sec
MAXimum
60 sec
Query delay
Query *RST default delay
Query lowest allowable delay
Query maximum allowable delay
Section
12,
"Limit
Testing," for details on
Testing," for

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