Multiple-Element Device Binning - Keithley SourceMeter 2400 User Manual

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2400 Series SourceMeter User's Manual Limit Testing 12-15

Multiple-element device binning

Figure 12-8 shows a basic binning system to test three-element resistor networks. Note
that this system requires a scanner card that is installed in a switching mainframe. Scanner
card switching is controlled through the Trigger Link. End binning control is required for
this test system, therefore, the grading mode must be used.
Trigger operations for the scanner and SourceMeter must be configured appropriately for
this test. In general, the scanner must be configured to scan three channels, and the
SourceMeter must be configured to perform a 3-point sweep and output a trigger to the
scanner after each measurement. See Section 11, "Triggering," for details.
When the testing process is started, Ch. 1 of the scanner card closes, and R1 is measured.
Two events occur concurrently after the measurement is completed: R1 is tested, and the
SourceMeter sends a trigger pulse to the switching mainframe causing Ch. 1 to open and
Ch. 2 to close. Assuming there is no failure, a measurement is then performed on R2.
While R2 is being tested, Ch. 2 opens and Ch. 3 closes. Again assuming no failure, a mea-
surement is performed on R3 and it is then tested. Assuming that all the tests on all three
resistors passed, the device package is placed in the pass bin.
If any of the resistors in the network fails a test, the FAIL message is displayed, and the
digital output information for the first failure is stored in memory (assuming that END
binning control is selected). After the sweep is completed, the SourceMeter sends the out-
put pattern stored in memory. This is the output pattern for the first test failure. The com-
ponent handler places the DUT package into the bin assigned to that particular failure.
The handler selects the next resistor network, and the testing process is repeated.
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