Test Button; Global Status; Default On Power-On - Microscan MS-3 User Manual

Test Button

The test button provides a convenient way to perform programmable operations both
globally and for each of the three programmable button positions.
The test button has three positions, each of which can be user-programmed to perform
a variety of functions.

Global Status

Definition: Determines the basic function of the test button.
Serial Cmd: <K770,global
Default: Enabled
Options: 0 = Disabled
3 = Unlatch Output
Disabled: When selected, the test button is disabled.
Enabled: When the Test button is enabled, the function of each button position can be
determined by the Test Button Mode command.
Trigger: When selected, the test button will act as a trigger for the scanner. All other
button operations will not be active. The trigger will operate the same way as an exter-
nal trigger.
Trigger mode
External Level
External Edge
Unlatch Output. When selected, will unlatch any outputs that have been latched via
"Latch Mode 1 (Unlatch on New Master Change)" on page

Default on Power-on

Definition: When enabled, if the test button is held down during power-on, the scan-
ner will default to customer defaults and save for power-on. This is the
same as sending a <Zrc> command.
Serial Cmd: <K770,global
Default: Enabled
Options: 0 = Disabled
status,default on power-on>
1 = Enabled
The read cycle endures for as long as the test button is pressed,
unless a timeout occurs and Timeout is enabled for End Of
Read Cycle.
As with Level, Edge allows a read cycle to be initiated by press-
ing the test button, but unlike Level mode, the read cycle ends
with a good read output, a timeout, or a new trigger.
status,default on
1 = Enabled
Chapter 6 I/O Parameters
2 = Trigger
Operation
power-on>
MS-3 Laser Scanner User's Manual
6-20.
6-15