Avaya MCC1 Maintenance Procedures page 358

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Additional maintenance procedures
DS1 CPE loopback jack (T1 only)
7
Enter
clear meas ds1 esf
8
Enter
list meas ds1 sum
troubleshooting, on page 358
Table 84: DS1 span troubleshooting
Displayed Field
Test: cpe-loopback-jack
Synchronized
Bit Error Count
9
Repeat Steps 5 through 8 as desired to observe bit error rate characteristics. Also, wait 1 to 10
minutes between Steps 5 through 7. One minute without errors translates to better than a 1 in 10 to
the eighth error rate. Ten minutes without errors translates to better than a 1 in 10 to the ninth error
rate.
358
location to clear the ESF error count.
location to display the bit error count. Refer to
for troubleshooting information.
Function
Indication
Pattern 3-in-24
The loopback jack test is active.
Y or N
If
synchronized to the looped 3-in-24
pattern and is accumulating a count of
the bit errors detected in the pattern until
the test has ended.
If
ending the test (Step 11) and re-starting
the test (Step 4).
If the circuit pack never synchronizes,
substantial bit errors in the 3-in-24
pattern are likely. This could be
intermittent connections or a broken
wire in a receive or transmit pair in the
CPE wiring.
Cumulative
If there are no wiring problems, the counter
count of
remains at 0.
detected errors
A count that pegs at 65535 or continues to
increment by several hundred to several
thousand on each list meas command
execution may indicate:
Intermittent or corroded connections
Severe crosstalk
Impedance imbalances between the two
conductors of the receive pair or the
transmit pair. Wiring may need
replacement.
Note that "ESF error events" counter and the
ESF performance counter summaries ("errored
seconds", "bursty errored seconds", and so
forth) will also increment. These counters are
not used with the loopback jack tests. However,
they will increment if errors are occurring.
Counters should be cleared following the test.
Table 84, DS1 span
appears, the DS1 circuit pack has
y
appears, retry the test five times by
n
Maintenance Procedures
December 2003

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