Using The Focus Aid (Mx-Fa) - Olympus MX63 Instructions Manual

Semiconductor/fpd/industrial inspection microscopes
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Using the focus aid (MX-FA)

When observing the sample with flat and mirror surface, use the focus
aid (MX-FA) to bring the sample into focus easily. Contact Olympus for
attaching the focus aid.
· The focus aid is available only with the reflected
NOTE
light brightfield observation, reflected light differential
interference contrast observation and reflected light
simple polarization observation.
· When observing the sample with uneven surface or
low reflectivity, the pattern of the graticule may not be
projected with good contrast.
Press-in the focus aid knob a to insert the graticule in the light path.
1
2
While looking through the eyepieces, rotate the coarse focusing and
fine focusing knobs to bring the sample into focus so that the lines
b of the graticule are clearly visible.
Pull out the focus aid knob a .
3
Be sure to remove the focus aid from the light path during
NOTE
observation.
MX63/MX63L
31
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Mx63l

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