Reflected Light Simultaneous Observation For Bf/Df Observation Procedures - Olympus MX63 Instructions Manual

Semiconductor/fpd/industrial inspection microscopes
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5-6 Reflected light simultaneous observation for BF/DF observation procedures

Set the main switch to (ON).
Select BF (reflected light brightfield observation).
Remove the analyzer, mirror unit, etc. from
the light path.
Place a sample for observation on the stage.
Use the objective selection button to engage
the 5X or 10X objective in the light path and
bring the sample into focus.
Engage the objective with the magnification to be used
in the light path and bring the sample into focus.
diaphragm during brightfield observation.
Insert the MIX slider for reflected light observation.
Observation
[Trinocular tube only]
Push in the light path selection knob.
Adjust the brightness
(illumination voltage).
Adjust the interpupillary distance.
Adjust the diopter.
Adjust the brightness.
Insert the required filters.
Use only for fine adjustment of aperture
MX63/MX63L
Operation part
Main switch
Observation light path selection knob
Light path selection knob
X-axis/Y-axis knobs
Objective selection button
Coarse focusing knob / Fine focusing
knob
Light intensity knob
Interpupillary distance adjustment
scale
Diopter adjustment ring
Objective selection button
Coarse focusing knob / Fine focusing
knob
Light intensity knob
Filter insertion slot
Aperture diaphragm open/close
button
MIX slider for reflected light
observation
Page
P.24
P.25
P.26
P.27
P.28
P.29
P.32
P.35
P.35
P.28
P.29
P.32
P.39
P.38
P.58
57
57

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Mx63l

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